Atomic Force Microscopy Laboratory

Atomic Force Microscopy Laboratory 2017-11-29T23:28:10+00:00

Research

Laboratory Equipments

Atomic Force Microscopy (AFM) is a new-generation microscopy imaging technique that provides information about surface topography at the nanometer scale. From information collected by a detector consisting of an atomic-scale mechanical tip, a high-resolution three-dimensional image of the surface is obtained. The main objectives include; analysis and research regarding nano-scale structures and the understanding of physical properties and synthesis of structures in the nanoscale. Atomic force microscopy is used in a wide range of applications which include food, electronics, environmental, medicine, telecommunications, biomedical, chemical, automotive, aerospace and energy technologies.

-Atomik Kuvvet Mikroskobu, Nanomagnetics Instruments

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