Atomic Force Microscopy (AFM) is a new-generation microscopy imaging technique that provides information about surface topography at the nanometer scale. From information collected by a detector consisting of an atomic-scale mechanical tip, a high-resolution three-dimensional image of the surface is obtained. The main objectives include; analysis and research regarding nano-scale structures and the understanding of physical properties and synthesis of structures in the nanoscale. Atomic force microscopy is used in a wide range of applications which include food, electronics, environmental, medicine, telecommunications, biomedical, chemical, automotive, aerospace and energy technologies.
-Atomik Kuvvet Mikroskobu, Nanomagnetics Instruments